000 00379nam a2200133Ia 4500
008 140224s9999 xx 000 0 und d
082 _a311:519.2 H7;1
100 _aWald, Abraham
245 _aSequential analysis
260 _aNew York
_bJohn Wiley & Sons
_c1952
300 _axii,212p.
650 _aSequential analysis,Statistics,Biometrics,Statistical analysis
942 _cBK
999 _c95801
_d95801